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IEEE 592-2007

May 2008 Revised

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Abstract

Revision Standard - Superseded. Revision of IEEE Std 592-1990. Design test for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV is provided in this standard.

Document information

Standard from IEEE
Published: 8 May 2008
Document type: IS
Pages
ISBN: 978-0-7381-5348-3

Publisher IEEE
Distributor IEEE
ICS 29.120.20
Technical Committee IEEE Power and Energy Society / Insulated Conductors

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Revised by: IEEE 592-2018
Revised by: IEEE 592-2018
Referred by: IEEE 386-2016
Referred by: IEEE 386-2016
Referred by: IEEE 1816-2013
Referred by: IEEE 1816-2013
Referred by: IEEE 1816-2013
Referred by: IEEE 404-2012
Referred by: IEEE 386-2006
Refers: IEEE 386-2006
Refers: IEEE 404-2006
Revises: IEEE 592-1990

IEEE 592-2007

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IEEE 592-2018

IEEE 592-2018

IEEE 592-2007

IEEE 592-1990

IEEE 592-1977

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