Standard

IEEE 592-1977

Nov 1977 Revised

Note: This standard has a new edition: IEEE 592-2018

Corrigendums and amendments are bought separately.

Language English

Services Read online + Print/Download €48.00 Read online €40.00

There are no extended editions available for this standard

There are no available corrigendum or amendments for this standard. Any future corrigendum and amendments will be added automatically for subscribers.

Abstract

New IEEE Standard - Superseded. IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Insulated Connectors, provides design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.

Document information

Standard from IEEE
Published: 29 November 1977
Document type: IS
Pages
ISBN: 978-0-7381-4388-0

Publisher IEEE
Distributor IEEE
ICS 29.120.20
Technical Committee IEEE Power and Energy Society / Insulated Conductors

Product Relations

Referred by: IEEE 404-1986
Revised by: IEEE 592-1990

IEEE 592-1977

Create subscription

Benefits of a subscription:

IEEE 592-2018

IEEE 592-2018

IEEE 592-2007

IEEE 592-1990

IEEE 592-1977

Abstract

Document information

Product Relations

Create subscription

Benefits of a subscription:

Extended editions Extended editions (0)

Version history Related corrigendum and amendments (0)

Version history History (5)

IEEE 592-2018

IEEE 592-2018

IEEE 592-2007

IEEE 592-1990

IEEE 592-1977

Abstract

Document information

Product Relations