Standardi

IEEE 488.1-1987

Enums.Sd.Shared.Models.DocumentStatus.Revised

Lisää mahdolliset korjaukset ja lisäykset ostoskoriin alta.

Kieli
Toimitustavat

Soveltamisala

Revision Standard - Superseded. Superseded by 488.1-2003. Interface systems used to interconnect both programmable and nonprogrammable electronic measuring apparatus with other apparatus and accessories necessary to assemble instrumentation systems are considered. The standard applies to the interface of instrumentation systems, or portions of them, in which the: data exchanged among the interconnected apparatus is digital, the number of devices that may be interconnected by one contiguous bus does not exceed 15, total transmission path lengths over the interconnecting cables do not exceed 20 m, and the data rate across the interface on any signal line does not exceed 1 Mb/s. The basic functional specifications of this standard may also be used in digital interface applications that require longer distances, more devices, increased noise immunity, or combinations of these.

Julkaisun tiedot

  • Standardi julkaisijalta IEEE
  • Julkaistu:
  • Julkaisutyyppi: IS
  • products.specs.pages
  • Publisher IEEE
  • Distributor IEEE
  • ICS 35.200
  • Tekninen komitea IEEE Instrumentation and Measurement Society / TC8 - Automated Test Systems and Instrumentation

Sidokset

  • On korvattu: IEEE 488.1-2003
  • Enums.Sd.Shared.Models.ProductRelationType.REFERRED_BY: IEEE 488.2-1987
  • Korvaa: IEEE 488-1978
  • Enums.Sd.Shared.Models.ProductRelationType.REFERS: IEC Publication 348 (1978), Safety Requirements for Electronic Measuring Apparatus.
  • Enums.Sd.Shared.Models.ProductRelationType.REFERS: ANSI X3.4-1986, American National Standard Code for Information Interchange Coded Character Set — 7-Bit.
  • Enums.Sd.Shared.Models.ProductRelationType.REFERS: IEC Publication 359 (1971), Expression of the Functional Performance of Electronic Measuring Equipment
  • Enums.Sd.Shared.Models.ProductRelationType.REFERS: MIL STD 202F (1986), Test Method for Electronic and Electrical Component Parts.
  • Enums.Sd.Shared.Models.ProductRelationType.REFERS: IEC Publication 68, Basic Environmental Testing Procedures, Part 2, Test, (1982 ed).