Standard

SFS-EN IEC 63185:2021

Feb 2021 Withdrawn

Note: This standard has a new edition: SFS-EN IEC 63185:2025

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Abstract

IEC 63185:2020 relates to a measurement method for complex permittivity of a dielectric substrates at microwave and millimeter-wave frequencies. This method has been developed to evaluate the dielectric properties of low-loss materials used in microwave and millimeter-wave circuits and devices. It uses higher-order modes of a balanced-type circular disk resonator and provides broadband measurements of dielectric substrates by using one resonator, where the effect of excitation holes is taken into account accurately on the basis of the mode-matching analysis.

Document information

Standard from SFS-sähkö
Published: 5 February 2021
Edition: 1
Document type: IS
Pages
ISBN:

Publisher SFS
Distributor SFS-sähkö
Technical Committee CLC/SR 46F

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Replaced by: SFS-EN IEC 63185:2025

SFS-EN IEC 63185:2021

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