Standard

ISO/TS 25138:2019

Withdrawn

Note: This standard has a new edition: ISO/TS 25138:2025

Corrigendums and amendments are bought separately.

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Abstract

This document describes a glow-discharge optical-emission spectrometric method for the determination of the thickness, mass per unit area and chemical composition of metal oxide films. This method is applicable to oxide films 1 nm to 10 000 nm thick on metals. The metallic elements of the oxide can include one or more from Fe, Cr, Ni, Cu, Ti, Si, Mo, Zn, Mg, Mn, Zr and Al. Other elements that can be determined by the method are O, C, N, H, P and S.

Document information

  • Standard from ISO
  • Published:
  • Withdrawn:
  • Edition: 2
  • Document type: TS
  • Pages
  • Publisher ISO
  • Distributor ISO
  • ICS 71.040.40
  • ISO TC ISO/TC 201/SC 8

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