Standard

IEEE N42.31-2003

Aug 2003 Published

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Language English

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Abstract

New IEEE Standard - Active. Standard measurement and test procedures are established for wide-bandgap semiconductor detectors such as cadmium telluride (CdTe), cadmium-zinc-telluride (CdZnTe), and mercuric iodide (HgI2) that can be used at room temperature for the detection and quantitative characterization of gamma-rays, X-rays, and charged particles. Standard terminology and descriptions of the principal features of the detectors are included. Included in this standard is an annex on interfering electromagnetic noise, which is a factor in such measurements.

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Standard from IEEE/ANSI
Published: 20 August 2003
Document type: IS
Pages
ISBN:

Publisher IEEE/ANSI
Distributor IEEE/ANSI
ICS 17.240
ICS 31.080.01
Technical Committee National Committee on Radiation Instrumentation /

IEEE N42.31-2003

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IEEE N42.31-2003

IEEE N42.31-2003

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IEEE N42.31-2003

IEEE N42.31-2003

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