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Standard

IEEE 62860-2013

Published

Note: This standard has a new edition: IEEE 62860-2013

Corrigendums and amendments are bought separately.

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Abstract

Adoption Standard - Active. Recommended methods and standardized reporting practices for electrical characterization of printed and organic transistors are covered. Due to the nature of printed and organic electronics, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for printed and organic transistors. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic transistors.

Document information

  • Standard from IEEE/IEC
  • Published:
  • Document type: IS
  • Pages
  • Publisher IEEE/IEC
  • Distributor IEEE/IEC
  • ICS 07.030
  • ICS 31.080.30
  • Technical Committee /