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IEEE 1671.4-2007

Apr 2008 Revised

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Abstract

New IEEE Standard - Superseded. This document specifies an exchange format, utilizing XML, for identifying the test configuration used to test and diagnose a unit under test (UUT) on an automatic test system (ATS).

Document information

Standard from IEEE
Published: 30 April 2008
Document type: IS
Pages
ISBN: 978-0-7381-5370-4

Publisher IEEE
Distributor IEEE
ICS 35.240.30
Technical Committee IEEE SA Board of Governors / SCC20 - Test and Diagnosis for Electronic Systems

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Revised by: IEEE 1671.4-2014
Revised by: IEEE 1671.4-2014
Refers: IEEE 1671-2006

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