Standard

IEEE 1641-2010

Sep 2010 Withdrawn

Note: This standard has a new edition: IEEE 1641-2022

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Language English

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Abstract

Revision Standard - Inactive-Reserved. This standard provides the means to define and describe signals used in testing. It also provides a set of common basic signals, built upon formal mathematical specifications so that signals can be combined to form complex signals usable across all test platforms. This standard contains additional downloads at http://standards.ieee.org/downloads/1641/1641-2010

Document information

Standard from IEEE
Published: 17 September 2010
Withdrawn: 25 March 2021
Document type: IS
Pages
ISBN: 978-0-7381-6361-1

Publisher IEEE
Distributor IEEE
ICS 31.020
ICS 35.060
Technical Committee IEEE SA Board of Governors / SCC20 - Test and Diagnosis for Electronic Systems

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Revised by: IEEE 1641-2022
Revised by: IEEE 1641-2022
Referred by: IEEE 1641.1-2013
Referred by: IEEE 1641.1-2013
Referred by: IEEE 1641.1-2013
Revises: IEEE 1641-2004

IEEE 1641-2010

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IEEE 1641-2022

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IEEE 1641-2022

IEEE 1641-2022

IEEE 1641-2010

IEEE 1641-2004

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