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IEEE 1445-1998

Mar 1999 Revised

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Abstract

New IEEE Standard - Superseded. The information content and the data formats for the interchange of digital test program data between digital automated test program generators (DATPGs) and automatic test equipment (ATE) for board-level printed circuit assemblies are deÞned. This information can be broadly grouped into data that deÞnes the following: UUT Model, Stimulus and Response, Fault Dictionary, and Probe.

Document information

Standard from IEEE
Published: 10 March 1999
Document type: IS
Pages
ISBN: 978-0-7381-1554-2

Publisher IEEE
Distributor IEEE
ICS 35.080
Technical Committee IEEE SA Board of Governors / SCC20 - Test and Diagnosis for Electronic Systems

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Revised by: IEEE 1445-2016
Revised by: IEEE 1445-2016

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Abstract

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