Consolidated

IEC 60115-1:1999+AMD1:2001 CSV

May 2001 Revised

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Language English

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Abstract

Establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose. This consolidated version consists of the third edition (1999) and its amendment 1 (2001). Therefore, no need to order amendment in addition to this publication.

Document information

Consolidated from IEC
Published: 28 May 2001
Withdrawn: 21 July 2008
Edition: 3.1
Document type: IS
Pages
ISBN: 2831857325

Publisher IEC
Distributor IEC
ICS 31.040.10
ISO TC TC 40

Product Relations

Revised by: IEC 60115-1:2008 ED4
Revises: IEC 60115-1:1982 ED2

IEC 60115-1:1999+AMD1:2001 CSV

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