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Standardi

IEEE 759-1984

Kumottu
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Kieli
Toimitustavat

Soveltamisala

New IEEE Standard - Inactive-Withdrawn. Test procedures for X-ray spectrometers consisting of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer are presented. Energy resolution, spectral distortion, pulse-height linearity, counting rate effects, overload effects, pulse-height stability, and efficiency are covered. Test procedures for pulse-height analyzers and computers are not covered.

Julkaisun tiedot

  • Standardi julkaisijalta IEEE
  • Julkaistu:
  • Kumottu:
  • Julkaisutyyppi: IS
  • products.specs.pages
  • Publisher IEEE
  • Distributor IEEE
  • ICS 17.240
  • Tekninen komitea IEEE Nuclear and Plasma Sciences Society / Nuclear Instruments and Detectors

Sidokset

  • Enums.Sd.Shared.Models.ProductRelationType.REFERRED_BY: IEEE 1160-1993
  • Enums.Sd.Shared.Models.ProductRelationType.REFERS: IEEE 300-1988
  • Enums.Sd.Shared.Models.ProductRelationType.REFERRED_BY: IEEE 325-1986
  • Enums.Sd.Shared.Models.ProductRelationType.REFERS: IEEE 301-1976
  • Enums.Sd.Shared.Models.ProductRelationType.REFERS: IEC Publication 430 (1973), Test Procedures for Germanium Gamma-Ray Detectors.
  • Enums.Sd.Shared.Models.ProductRelationType.REFERS: IEC Publication 333 (1983), Test Procedures for Semiconductor Detectors
  • Enums.Sd.Shared.Models.ProductRelationType.REFERS: IEC Publication 340 (1979) (Second Edition), Test Procedures for Amplifiers and Preamplifier for Semiconductor Detectors for Ionizing Radiation.