Standard

IEEE P2818

Dec 2024 Draft

Corrigendums and amendments are bought separately.

Language English

Services Read online + Print/Download €82.00 Read online €55.00

There are no extended editions available for this standard

There are no available corrigendum or amendments for this standard. Any future corrigendum and amendments will be added automatically for subscribers.

There are no available history for this standard.

Abstract

New IEEE Standard - Active - Draft. This document describes an open standard for parts stress analysis and derating. It establishes uniform methods to increase a component's reliability margin by decreasing the amount of applied stress (i.e., voltage, current, temperature, power, etc.) to an electronic, electrical, or electromechanical part. Reducing the stress levels improves device reliability/durability by reducing failure rates, thereby improving the reliability and availability of the product.

Document information

Standard from IEEE
Published: 25 December 2024
Document type: IS
Pages
ISBN: 979-8-8557-0917-9

Publisher IEEE
Distributor IEEE
Technical Committee IEEE Reliability Society / IEEE Reliability Society Standards Committee

IEEE P2818

Create subscription

Benefits of a subscription:

Abstract

Document information

Create subscription

Benefits of a subscription:

Extended editions Extended editions (0)

Version history Related corrigendum and amendments (0)

Version history History (0)

Abstract

Document information