Standard

IEEE 62527-2007

Dec 2007 Revised

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Language English

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Abstract

New IEEE Standard - Active. This standard extends IEEE Std 1450-1999 (STIL) to support the definition of DC levels. STIL language constructs are defined to specify the DC conditions necessary to execute digital vectors on automated test equipment (ATE). STIL language extensions include structures for: (a) specifying the DC conditions for a device under test; (b) specifying DC conditions either globally, by pattern burst, by pattern, or by vector; (c) specifying alternate DC levels; and (d) selecting DC levels and alternate levels within a period, much the same as timed format events.

Document information

Standard from IEEE/IEC
Published: 9 December 2007
Document type: IS
Pages
ISBN: 9-7807-3815-7238

Publisher IEEE/IEC
Distributor IEEE/IEC
ICS 25.040
ICS 35.060
Technical Committee IEEE Computer Society / Test Technology

IEEE 62527-2007

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