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IEEE 1545-1999

Nov 1999 Withdrawn

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Language English

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Abstract

New IEEE Standard - Inactive-Withdrawn. Jan 2005: Administratively withdrawn. A language and file format for describing parametric test data is defined. Data types, dataformats, and file formats are included.

Document information

Standard from IEEE
Published: 15 November 1999
Withdrawn: 25 January 2005
Document type: IS
Pages
ISBN: 978-0-7381-1776-8

Publisher IEEE
Distributor IEEE
ICS 35.060
ICS 35.240.01
Technical Committee IEEE SA Board of Governors / SCC20 - Test and Diagnosis for Electronic Systems

IEEE 1545-1999

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