Standard

IEEE 1450.6.1-2009

Jul 2009 Withdrawn

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Abstract

New IEEE Standard - Inactive-Reserved. This standard defines how the necessary information is passed from scan insertion to pattern generation and from pattern generation to diagnosis such that different tool vendors could be used for each step independent of on-chip scan compression logic used.

Document information

Standard from IEEE
Published: 13 July 2009
Withdrawn: 5 March 2020
Document type: IS
Pages
ISBN: 978-0-7381-5962-1

Publisher IEEE
Distributor IEEE
ICS 35.060
Technical Committee IEEE Computer Society / Test Technology

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Refers: IEEE 1450.6-2005
Refers: IEEE 1450.1-2005
Refers: IEEE 1450.2-2002
Refers: IEEE 1450-1999

IEEE 1450.6.1-2009

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