Standard

IEC 62860:2013 ED1

Aug 2013 Published

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Language English

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Abstract

IEC 62860:2013(E) covers recommended methods and standardized reporting practices for electrical characterization of printed and organic transistors. Due to the nature of printed and organic electronics, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for printed and organic transistors. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic transistors. Keywords: electrical characterization, FET, flexible electronics, high impedance, nanocomposite, nanotechnology, OFET, organic electronics, organic transistor, printed electronics, printing, transistor

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Standard from IEEE
Published: 5 August 2013
Edition: 1
Document type: IS
Pages
ISBN: 9782832210147

Publisher IEEE
Distributor IEEE
ICS 07.030
ICS 07.120
ISO TC TC 113

IEC 62860:2013 ED1

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